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ICCAD
1994
IEEE
87views Hardware» more  ICCAD 1994»
14 years 3 months ago
On testing delay faults in macro-based combinational circuits
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...
Irith Pomeranz, Sudhakar M. Reddy
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
14 years 3 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
VTS
2003
IEEE
119views Hardware» more  VTS 2003»
14 years 4 months ago
A Circuit Level Fault Model for Resistive Opens and Bridges
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. ...
DFT
2003
IEEE
114views VLSI» more  DFT 2003»
14 years 4 months ago
CodSim -- A Combined Delay Fault Simulator
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
Wangqi Qiu, Xiang Lu, Zhuo Li, D. M. H. Walker, We...
ATS
2003
IEEE
131views Hardware» more  ATS 2003»
14 years 4 months ago
Software-Based Delay Fault Testing of Processor Cores
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hi...
DATE
2005
IEEE
127views Hardware» more  DATE 2005»
14 years 5 months ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
14 years 5 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
ETS
2006
IEEE
110views Hardware» more  ETS 2006»
14 years 5 months ago
Deterministic Logic BIST for Transition Fault Testing
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
Valentin Gherman, Hans-Joachim Wunderlich, Jü...
DATE
2007
IEEE
83views Hardware» more  DATE 2007»
14 years 5 months ago
High-level test synthesis for delay fault testability
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...
Sying-Jyan Wang, Tung-Hua Yeh