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ITC
2003
IEEE
132views Hardware» more  ITC 2003»
14 years 4 months ago
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muh...
ITC
2003
IEEE
276views Hardware» more  ITC 2003»
14 years 4 months ago
Automatic Diagnostic Program Generation for Mixed Signal Load Board
This paper describes a method for automatically generating diagnostic programs for mixed-signal load boards. This procedure employs a statistical method of computing Mahalanobis D...
Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N...
ITC
2003
IEEE
163views Hardware» more  ITC 2003»
14 years 4 months ago
Novel Transient Fault Hardened Static Latch
In this paper we analyze the effects of transient faults (TFs) affecting the internal nodes of conventional latch structures and we propose a new latch design which allows to tole...
Martin Omaña, Daniele Rossi, Cecilia Metra
ITC
2003
IEEE
123views Hardware» more  ITC 2003»
14 years 4 months ago
Hysteresis of Intrinsic IDDQ Currents
: Empirical analyses of the IDDQ signatures of 0.18 µm devices indicate that IDDQ currents exhibit hysteresis. A newly proposed test method, SPIRIT (Single Pattern Iteration IDDQ ...
Yukio Okuda, Nobuyuki Furukawa
ITC
2003
IEEE
135views Hardware» more  ITC 2003»
14 years 4 months ago
MEMS Design And Verification
The long term impact of MEMS technology will be in its ability to integrate novel sensing and actuation functionality on traditional computing and communication devices enabling t...
Tamal Mukherjee
ITC
2003
IEEE
124views Hardware» more  ITC 2003»
14 years 4 months ago
On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding
We propose a procedure for designing an LFSRbased circuit for masking of unknown output values that appear in the output response of a circuit tested using LBIST. The procedure is...
Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, S...
ITC
2003
IEEE
141views Hardware» more  ITC 2003»
14 years 4 months ago
Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits
In this paper, a new paradigm for designing logic circuits with concurrent error detection (CED) is described. The key idea is to exploit the asymmetric soft error susceptibility ...
Kartik Mohanram, Nur A. Touba
ITC
2003
IEEE
119views Hardware» more  ITC 2003»
14 years 4 months ago
Defect Tolerance at the End of the Roadmap
Defect tolerance will become more important as feature sizes shrink closer to single digit nanometer dimensions. This is true whether the chips are manufactured using topdown meth...
Mahim Mishra, Seth Copen Goldstein
ITC
2003
IEEE
168views Hardware» more  ITC 2003»
14 years 4 months ago
Agent Based DBIST/DBISR And Its Web/Wireless Management
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
Liviu Miclea, Szilárd Enyedi, Gavril Todere...
ITC
2003
IEEE
123views Hardware» more  ITC 2003»
14 years 4 months ago
A Comprehensive Approach to Assessing and Analyzing 1149.1 Test Logic
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...
Kevin Melocco, Hina Arora, Paul Setlak, Gary Kunse...